The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
May. 21, 2004
Randall Geiger, Boone, IA (US);
Kumar Parthasarathy, Dallas, TX (US);
Degang Chen, Ames, IA (US);
Le Jin, Ames, IA (US);
Turker Kuyel, Austin, TX (US);
Randall Geiger, Boone, IA (US);
Kumar Parthasarathy, Dallas, TX (US);
Degang Chen, Ames, IA (US);
Le Jin, Ames, IA (US);
Turker Kuyel, Austin, TX (US);
Iowa State University Research Foundation, Inc., Ames, IA (US);
Texas Instruments, Inc., Dallas, TX (US);
Abstract
A method for testing a circuit includes determining at least one performance characteristic of the circuit based on a functional relationship between excitation signals or on a functional relationship between measurement devices. The method is implemented either as a part of a built-in self test circuit of an integrated circuit or for production testing.