The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Aug. 25, 2005
Kazuhiro Tashiro, Kawasaki, JP;
Yasuyuki Itou, Kawasaki, JP;
Shigeyuki Maruyama, Kawasaki, JP;
Yoshikazu Arisaka, Kawasaki, JP;
Kazuhiro Tashiro, Kawasaki, JP;
Yasuyuki Itou, Kawasaki, JP;
Shigeyuki Maruyama, Kawasaki, JP;
Yoshikazu Arisaka, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A testing device can perform a test on an arbitrary one of a plurality of semiconductor devices by pressing the semiconductor devices onto a contactor from a back side of the semiconductor device. A test circuit board has a contactor provided with contact pieces corresponding to external connection terminals of semiconductor devices to be tested. A support board is capable of mounting the semiconductor devices thereon in an aligned state. A stage supports the support board. A press head presses the semiconductor devices to be tested mounted on the support board so as to cause external connection terminals of the semiconductor devices to be tested to contact with the contact pieces of the contactor. The stage is movable to a position at which at least one of the semiconductor devices to be tested, which are mounted on the support board, faces the contactor.