The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7128587 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 31, 2006

Filed:

Nov. 01, 2005
Applicants:

Benjamin N. Eldridge, Danville, CA (US);

Carl V. Reynolds, Pleasanton, CA (US);

Inventors:

Benjamin N. Eldridge, Danville, CA (US);

Carl V. Reynolds, Pleasanton, CA (US);

Assignee:

FormFactor, Inc., Livermore, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 13/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a cover over electrical contacts of a probe card used in testing die on a wafer. A testing machine is disclosed as having the covered probe card therein. Various mechanisms for uncovering the electrical contacts while it is located in the tester machine are disclosed.


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Eldridge, Benjamin. (2006). Probe card covering system and method (U.S. Patent No. 7128587). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7128587

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