The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Nov. 05, 2004
Sergey D. Fonov, Kettering, OH (US);
E. Grant Jones, Troy, OH (US);
Jim W. Crafton, Fairborn, OH (US);
Sergey D. Fonov, Kettering, OH (US);
E. Grant Jones, Troy, OH (US);
Jim W. Crafton, Fairborn, OH (US);
Innovative Scientific Solutions, Inc., Dayton, OH (US);
Abstract
A method of measuring a load on a surface produced by a contact force. An elastic film or coating is located on a supporting surface to provide an indication of normal and tangential or shear forces applied to the surface. A thickness measurement, corresponding to a normal displacement, and a tangential displacement of the film, corresponding to a shear displacement, is obtained and input to a response function to reconstruct the normal and shear load components of the contact force on the surface. A differential thickness measurement of the film is detected by an optical method in which a luminescent output from a luminophore in the film is measured. A luminescent output from a reference luminophore located below the film is also measured to provide a measurement system independent of the illumination source used to produce the luminescent output.