The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7127689 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 24, 2006

Filed:

May. 28, 2004
Applicants:

Paul D. Kartschoke, Williston, VT (US);

Thomas G. Mitchell, Essex Junction, VT (US);

Norman J. Rohrer, Underhill, VT (US);

Ronald D. Rose, Essex Junction, VT (US);

Inventors:

Paul D. Kartschoke, Williston, VT (US);

Thomas G. Mitchell, Essex Junction, VT (US);

Norman J. Rohrer, Underhill, VT (US);

Ronald D. Rose, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is disclosed for preventing circuit failures due to gate oxide leakage, and is used to efficiently check many nets of a circuit on a chip or within a macro to find logical fails due to gate oxide leakage using DC calculations, wherein the gate leakage is treated as a noise source for a static noise analysis of the circuit.


Find Patent Forward Citations

Kartschoke, Paul. (2006). Method for preventing circuit failures due to gate oxide leakage (U.S. Patent No. 7127689). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7127689

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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