The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2006
Filed:
Sep. 23, 2003
Lewis M. Nashner, Portland, OR (US);
Lewis M. Nashner, Portland, OR (US);
NeuroCom International, Inc., Clackamas, OR (US);
Abstract
A system for detecting a screening-test error includes a measurement device that measures at least one performance parameter related to at least one screening-test task and a computational device, in communication with the measurement device. The computational device receives the at least one measured performance parameter, calculates at least one performance statistical quantity characterizing the measured performance parameter, and compares the at least one performance statistical quantity to at least one reference statistical quantity associated with an error-free screening test. In accordance with a related embodiment, the system may further include a display device that displays the extent to which the at least one performance statistical quantity differs from the at least one reference statistical quantity.