The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

Aug. 30, 2002
Applicants:

Larry D. Barto, Austin, TX (US);

Yiwei LI, Austin, TX (US);

Steven C. Nettles, Johnson City, TX (US);

H. Van Dyke Parunak, Ann Arbor, MI (US);

Inventors:

Larry D. Barto, Austin, TX (US);

Yiwei Li, Austin, TX (US);

Steven C. Nettles, Johnson City, TX (US);

H. Van Dyke Parunak, Ann Arbor, MI (US);

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for generating a cost function includes providing a resource for processing a workpiece. A plurality of cost function parameters is provided. A library of parameterized cost function components is acessed based on the plurality of cost function parameters to generate a cost function for processing the workpiece using the resource. A system includes a resource for processing a workpiece and at least one scheduling agent. The scheduling agent is configured to provide a plurality of cost function parameters and access a library of parameterized cost function components based on the plurality of cost function parameters to generate a cost function for processing the workpiece using the resource.


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