The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

Aug. 05, 2002
Applicants:

Yuqiao Liu, Sunnyvale, CA (US);

Wei-shin Tsay, Saratoga, CA (US);

Inventors:

Yuqiao Liu, Sunnyvale, CA (US);

Wei-Shin Tsay, Saratoga, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for calibrating tunable optical devices using a probing signal as a reference so as to achieve an accurate control over an absolute wavelength of the tunable optical devices. A probing signal being a calibrated optical signal with a spectrum centered at a desired add/drop channel or wavelength is introduced into an N-port circulator coupled between two tunable optical devices. When the two tunable optical devices are tuned not exactly at the desired wavelength, a portion of probing signal will be reflected or dropped out by the two tunable optical devices. The dropped probing signal is detected and coupled to a signal processor or circuitry configured to generate adjustments to or the control signals for controlling the tunable optical devices in accordance with the reflected probing signal being maximized.


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