The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2006
Filed:
Jun. 25, 2001
Lothar Wenzel, Round Rock, TX (US);
Dinesh Nair, Austin, TX (US);
Ram Rajagopal, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for analyzing an image. The system may comprise a computer which includes a CPU and a memory medium which is operable to store one or more programs executable by the CPU to perform the method. The method may include: 1) receiving data describing an n-dimensional image, wherein the image is defined in a bounded n-dimensional space, wherein the image is embedded in an m-dimensional real space via an embedding function x( ), and wherein m>n; 2) determining a diffeomorphism (f,g) of the n-dimensional space; 3) computing the inverse transform (f,g) of the determined diffeomorphism (f,g); 4) selecting a plurality of points in the n-dimensional space; 5) mapping the plurality of points onto the image using x(f,g) thereby generating a mapped plurality of points on the image; and 6) analyzing the mapped plurality of points to determine characteristics of the image.