The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

May. 17, 2004
Applicants:

William Rassman, Los Angeles, CA (US);

David Ralin, South Pasadena, CA (US);

Robert A. Lieberman, Torrance, CA (US);

Lothar U. Kempen, Redondo Beach, CA (US);

Herbert Shapiro, Laguna Niguel, CA (US);

Inventors:

William Rassman, Los Angeles, CA (US);

David Ralin, South Pasadena, CA (US);

Robert A. Lieberman, Torrance, CA (US);

Lothar U. Kempen, Redondo Beach, CA (US);

Herbert Shapiro, Laguna Niguel, CA (US);

Assignee:

Maven Technologies, LLC, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for scanning of a microarray to provide an image of the microarray are disclosed. Data related to change in polarization state of a scanning light beam for individual points or lines or other portion of the microarray are collected and processed to image the microarray at high resolution and speed.


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