The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2006
Filed:
Jun. 19, 2003
Steven Clyde Hill, Silver Spring, MD (US);
Ronald Gene Pinnick, Columbia, MD (US);
Yong-le Pan, Cheshire, CT (US);
Kevin Bruce Aptowicz, New Haven, CT (US);
Kristan P. Gurton, Ashton, MD (US);
Richard Kounai Chang, Hamden, CT (US);
Steven Clyde Hill, Silver Spring, MD (US);
Ronald Gene Pinnick, Columbia, MD (US);
Yong-Le Pan, Cheshire, CT (US);
Kevin Bruce Aptowicz, New Haven, CT (US);
Kristan P. Gurton, Ashton, MD (US);
Richard Kounai Chang, Hamden, CT (US);
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Abstract
Characterizing individual airborne particles in real time according to their absorption of optical energy at one or more wavelengths. The instrument can measure the two-dimensional angular optical scattering (TAOS) and/or the one-dimensional angular optical scattering (ODAOS) at one or more wavelengths. When two wavelengths are used, one is chosen to be on an absorption peak, the other is off of the absorption peak (preferably in the absorption valley).