The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2006
Filed:
Aug. 20, 2004
Hidekazu Shimomura, Kanagawa, JP;
Ken Tanimura, Tochigi, JP;
Hidekazu Shimomura, Kanagawa, JP;
Ken Tanimura, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
There is provided a diffraction grid which is easily produced without reducing a grid size. There is provided an optical scanning device having effects such as a chromatic aberration correction and a temperature compensation even when a short wavelength light source having a wavelength of 500 nm or less is used, and an image forming apparatus using the optical scanning device. In the optical scanning device having the diffraction grid, for which the short wavelength light source having a wavelength of 500 nm or less is used, a design order of the diffraction grid is set to a diffraction order equal to or larger than a second order to obtain a grid shape which is easily formed.