The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2006
Filed:
Jun. 12, 2002
Tomislav Jasa, Mississauga, CA;
Zorawar S. Bassi, Markham, CA;
Louie Lee, Richmond Hill, CA;
Silicon Optix Inc., San Jose, CA (US);
Abstract
An image transformation method for translating a non-linear 2D geometrical transformation into two separable 1D geometrical transformations first determines the inverse of the 2D geometrical transformation to form an inverse 2D geometrical transformation. Then the method converts the inverse 2D geometrical transformation into an analytical inverted 2D geometrical transformation and separates the analytical inverse 2D geometrical transformation into first and second 1D geometrical transformations. The method then represents said inverse 2D geometrical transformation and first and second 1D geometrical transformations as tensor spline surfaces and then compares an evaluation of said first and second 1D geometrical transformations at each pixel with an evaluation of the analytical inverse 2D geometrical transformation at each pixel. If the error evaluation does not meet a predetermined level of performance then the separation and transformation steps are repeated. Since the method involves one-dimensional spatial transform processing it results in reduced calculations, efficient memory access, and ability to process data in a real-time environment. In-addition, since the method provides a compact representation of the spatial transforms, it can be scaled for a particular level of precision.