The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

Oct. 22, 2003
Applicants:

Arnulf Pietsch, Regensburg, DE;

Karlheinz Wamke, Obertraubling, DE;

Gerhard Wild, Regensburg, DE;

Inventors:

Arnulf Pietsch, Regensburg, DE;

Karlheinz Wamke, Obertraubling, DE;

Gerhard Wild, Regensburg, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method and a circuit arrangement for determining an electric measurement value for a resistance element (R), preferably for determining an electric current that flows through said resistance element (R), whereby the resistance element (R) to be measured is interconnected to additional resistance elements within a resistance array () consisting of columns (CL, CL, CL) and rows (R, R, R) of resistance elements. According to the invention, the load of a basic load resistance element (R), which is connected between the output of a measurement/supply unit () and the common ground terminal connection of the resistance array (), is applied to the measurement voltage (MEAS). The measurement voltage (MEAS) is simultaneously connected to the input of an impedance transformer (OCL, OR), whose output is connected in a subsequent step to the resistance elements in the resistance array () that are not to be measured. This prevents a voltage differential at the input of the operation amplifier, eliminating to a great extent undesired signal fluctuations, which could falsify the measurement result.


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