The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

Jan. 29, 2003
Applicants:

Kai Eck, Aachen, DE;

Hans-aloys Wischmann, Aachen, DE;

Inventors:

Kai Eck, Aachen, DE;

Hans-Aloys Wischmann, Aachen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method and a device for automatic testing of an X-ray system (). The doors () leading to the room () in which the X-ray system () is installed are monitored by way of sensors (). Furthermore, the state of the room () can be monitored by means of further sensors such as video cameras (). Automatic testing of the X-ray system () while utilizing X-rays is started only if and for as long as all doors are closed and the other sensors do not indicate that a safe state is abandoned. The device may also include facilities for automatically positioning a phantom in the beam path. Such facilities may in that case include a phantom which is provided on a flexible foil.


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