The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

Oct. 28, 2004
Applicants:

Kohei Osawa, Suwa, JP;

Norio Nagata, Matsumoto, JP;

Kunio Omura, Shiojiri, JP;

Inventors:

Kohei Osawa, Suwa, JP;

Norio Nagata, Matsumoto, JP;

Kunio Omura, Shiojiri, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65H 7/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multifeed detection apparatus and method for use in a check processing terminal including a paper supply unit for individually feeding a plurality of checks from the paper supply unit along a check transportation path in a given direction; a MICR head having a non-movable contact surface on one side of the check transportation path; a pressure member disposed on another side of the check transportation path opposite the non-movable contact surface for pressing one or more transported checks between the pressure member and the MICR head; and a displacement detection sensor for detecting physical displacement of the pressure member from the non-movable contact surface to indicate check thickness.


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