The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7124670 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 24, 2006

Filed:

Jul. 23, 2001
Applicants:

Shigeru Tanaka, Kanagawa, JP;

Shigeki Morisawa, Mie-ken, JP;

Inventors:

Shigeru Tanaka, Kanagawa, JP;

Shigeki Morisawa, Mie-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B26D 5/00 (2006.01); B23Q 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for estimating a lifetime of a cutter for cutting a sheet comprising: a detector for detecting a value of a parameter representing a cutting resistance during sheet cutting; a comparator for comparing the detected value of the parameter with a predetermined reference value; and an output element for outputting a result based on the comparison.


Find Patent Forward Citations

Tanaka, Shigeru. (2006). Method and apparatus for estimating a life-span of a cutter (U.S. Patent No. 7124670). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7124670

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…