The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

Aug. 09, 2004
Applicants:

Warren D. Ketola, St. Paul, MN (US);

Richard M. Fischer, Jr., Hudson, WI (US);

Inventors:

Warren D. Ketola, St. Paul, MN (US);

Richard M. Fischer, Jr., Hudson, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 17/00 (2006.01); H01J 9/42 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and devices for accelerated light stability testing are described. The method comprises exposing a component to light having a total irradiance at wavelengths between 300 nm and 500 nm wherein the irradiance at wavelengths ranging from 300 nm to 350 nm is less than 3.1% of the total irradiance; the irradiance at wavelengths ranging from greater than 350 nm to 380 nm ranges from 0.2% to 2.2% of the total irradiance; the irradiance at wavelengths ranging from greater than 380 nm to 420 nm ranges from 4.5% to 9.1% of the total irradiance; and the irradiance at wavelength ranging from greater than 420 nm to 500 nm ranges from about 86% to about 95% of the total irradiance.


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