The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2006
Filed:
May. 17, 2005
Masayuki Kurita, Fujisawa, JP;
Remmelt Pit, Cupertino, CA (US);
Shozo Saegusa, Chiyoda-machi, JP;
Toshiya Shiramatsu, Odawara, JP;
Mike Suk, San Jose, CA (US);
Hideaki Tanaka, Odawara, JP;
Masayuki Kurita, Fujisawa, JP;
Remmelt Pit, Cupertino, CA (US);
Shozo Saegusa, Chiyoda-machi, JP;
Toshiya Shiramatsu, Odawara, JP;
Mike Suk, San Jose, CA (US);
Hideaki Tanaka, Odawara, JP;
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive protrusion pad located on its trailing end. The linear velocity of the disk relative to the slider maintains the slider at its nominal fly height, which is typically higher than any expected asperity. With no current applied to the heater, the protrusion pad is generally flush with the air-bearing surface of the slider. Increasing levels of current are applied to the heater, which causes movement of the protrusion pad toward the disk surface. When the pad contacts an asperity, the current level applied at the instant of asperity contact is recorded. The applied current level can be correlated to the glide height from a previous calibration process using a calibration disk with known calibration bump heights.