The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2006
Filed:
Aug. 18, 2003
Moshe Olim, Eden Prairie, MN (US);
Stefan Weissner, Minneapolis, MN (US);
Ling MA, Eden Prairie, MN (US);
Clarence Matson, Eden Prairie, MN (US);
Sarah R. Marotz, Bloomington, MN (US);
James Wagner, Prior Lake, MN (US);
Zine-eddine Boutaghou, North Oaks, MN (US);
Peter R. Goglia, Edina, MN (US);
Moshe Olim, Eden Prairie, MN (US);
Stefan Weissner, Minneapolis, MN (US);
Ling Ma, Eden Prairie, MN (US);
Clarence Matson, Eden Prairie, MN (US);
Sarah R. Marotz, Bloomington, MN (US);
James Wagner, Prior Lake, MN (US);
Zine-Eddine Boutaghou, North Oaks, MN (US);
Peter R. Goglia, Edina, MN (US);
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
A method and apparatus are provided characterizing the shape of a surface such as a bearing surface on a slider and for processing the shape. The shape is characterized by fitting a curve having a desired shape to measurement data and then determining residual deviations from the desired shape within localized regions. The surface is processed by selecting a material stress pattern to be applied to a working surface of the slider based on measured and desired contour shape parameters in a plurality of localized areas on the bearing surface. The measured contour shape parameter within a first of the plurality of localized areas is weighted more heavily than those within the other localized areas.