The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2006

Filed:

Jun. 28, 2002
Applicants:

Pyungchul Kim, Snoqualmie, WA (US);

Zhaohui Tang, Bellevue, WA (US);

David Earl Heckerman, Bellevue, WA (US);

Scott Conrad Oveson, Sammamish, WA (US);

Inventors:

Pyungchul Kim, Snoqualmie, WA (US);

Zhaohui Tang, Bellevue, WA (US);

David Earl Heckerman, Bellevue, WA (US);

Scott Conrad Oveson, Sammamish, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06E 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are provided for producing displays of the accuracy of data mining or statistical models that produce associative predictions. For all cases in a testing data set, the model makes predictions and provides associated probabilities. The cases are sorted by their probability of making accurate predictions and a graph is made of the accuracy of the model over various subsets containing the highest probability cases as evaluated by the model. Where a number of probabilities are presented for the predictions in a basket of predictions, those probabilities are combined to yield a probability score for the entire basket. Additionally, the accuracy of a model over different basket sizes may be graphed. The accuracy graph may also be produced for any models making a prediction, by graphing the probability of making accurate predictions and a graph made of the accuracy of the model over various subsets of the data containing the highest probability cases.


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