The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Jan. 03, 2005
Kenneth H. Wong, Santa Rosa, CA (US);
David V. Blackham, Santa Rosa, CA (US);
James C. Liu, Santa Rosa, CA (US);
Keith F. Anderson, Santa Rosa, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
David V. Blackham, Santa Rosa, CA (US);
James C. Liu, Santa Rosa, CA (US);
Keith F. Anderson, Santa Rosa, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
In one embodiment, a method comprises storing parameters that are related to switch error correction terms of a vector network analyzer (VNA), and applying a calibration process of a TRL group of calibration processes to the VNA to generate calibration measurements, wherein the calibration process generates calibration measurements, calculates a switch error correction matrix using the stored parameters and a subset of the calibration measurements, and applies the switch error correction matrix to calibration measurements before solving for eight-systematic error terms associated with the calibration process.