The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Sep. 03, 2004
Yongcang Zhang, Troy, MI (US);
David E. Herbert, Rochester Hills, MI (US);
Yongcang Zhang, Troy, MI (US);
David E. Herbert, Rochester Hills, MI (US);
Eaton Corporation, Cleveland, OH (US);
Abstract
The present invention relates to a method of analyzing accuracy of linear sensor output based on a theoretical prediction of the output model. The method comprises steps of: analyzing a statistically significant number of linear sensors to obtain operating profiles at two or more operating conditions; individually testing a linear sensor to obtain at least four data points; developing a theoretical prediction of the output model for each operating condition from the four data points; and comparing accuracy of the relationship between the theoretical prediction of the output model to sensor output in the operating profile corresponding to a given input for the same operating condition. Also disclosed are calibration algorithms associated therewith, as well as mechatronic units and further assemblies therefrom.