The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Apr. 30, 2002
Catherine R. Condie, Shoreview, MN (US);
Gerald A. Portzline, Fridley, MN (US);
Yong Kyun Cho, Maple Grove, MN (US);
John S. Brandstetter, Coon Rapids, MN (US);
Luc R. Mongeon, Minneapolis, MN (US);
Lucy M. Nichols, Maple Grove, MN (US);
Steve R Hornberger, Minneapolis, MN (US);
Catherine R. Condie, Shoreview, MN (US);
Gerald A. Portzline, Fridley, MN (US);
Yong Kyun Cho, Maple Grove, MN (US);
John S. Brandstetter, Coon Rapids, MN (US);
Luc R. Mongeon, Minneapolis, MN (US);
Lucy M. Nichols, Maple Grove, MN (US);
Steve R Hornberger, Minneapolis, MN (US);
Medtronic, Inc., Minneapolis, MN (US);
Abstract
A method and an apparatus for performing implementing external data into an implantable medical device. A first stress test is performed using an external sensor. External data resulting from the initial stress test is acquired. An external data injection process is performed. The external data injection process includes providing the external data to the implantable medical device. A second stress test is performed, the second stress test being substantially similar to the first stress test. Internal data resulting from the second stress test is acquired. Internal data resulting from the second stress test along with the external data resulting from the first stress test, are processed.