The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2006

Filed:

Nov. 23, 2004
Applicants:

Toshihiko Baba, Tokyo, JP;

Daisuke Mori, Kanagawa, JP;

Inventors:

Toshihiko Baba, Tokyo, JP;

Daisuke Mori, Kanagawa, JP;

Assignees:

Ricoh Company, LTD, Tokyo, JP;

Toshihiko Baba, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical control element is disclosed that can be made small and has a low loss, and is able to provide group speed control and wavelength dispersion of short light pulses. The optical control element is formed from a photonic crystal, and includes a first portion having a first refraction index in the photonic crystal, a second portion having a second refraction index lower than the first refraction index, and a refraction-index-distributed type defect wave guide. A difference effective refraction indexes between the first portion and the second portion near the refraction-index-distributed type defect wave guide, changing continuously or stepwise along a wave guiding direction of the refraction-index-distributed type defect wave guide.


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