The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Jan. 21, 2003
Madhusudhana Gargesha, Tempe, AZ (US);
Sethuraman Panchanathan, Gilbert, AZ (US);
Madhusudhana Gargesha, Tempe, AZ (US);
Sethuraman Panchanathan, Gilbert, AZ (US);
Arizona State University, Tempe, AZ (US);
Abstract
An image classification system uses curvature-based multi-scale morphology to classify an image by its most distinguishing features. The image is recorded in digital form. Curvature features associated with the image are determined. A structuring element is modulated based on the curvature features. The shape of the structuring element is controlled by making it a function of both the scaling factor and the principal curvatures of the intensity surface of the face image. The structuring element modulated with the curvature features is superimposed on the image to determine a feature vector of the image using mathematical morphology. When this Curvature-based Multi-scale Morphology (CMM) technique is applied to face images, a high-dimensional feature vector is obtained. The dimensionality of this feature vector is reduced by using the PCA technique, and the low-dimensional feature vectors are analyzed using an Enhanced FLD Model (EFM) for superior classification performance.