The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Feb. 10, 2003
Maryellen L. Giger, Elmhurst, IL (US);
Zhimin Huo, Chicago, IL (US);
Carl J. Vyborny, Riverside, IL (US);
Maryellen L. Giger, Elmhurst, IL (US);
Zhimin Huo, Chicago, IL (US);
Carl J. Vyborny, Riverside, IL (US);
University of Chicago, Chicago, IL (US);
Abstract
A method of calculating a disease assessment by analyzing a medical image, comprising (1) extracting at least one lesion feature value from the medical image; (2) extracting at least one risk feature value from the medical image; and (3) determining the disease assessment based on the at least one lesion feature value and the at least one risk feature value. The method employs lesion characterization for characterizing the lesion, and risk assessment based on the lesion's surroundings, i.e., the environment local and distal to the lesion. Computerized methods both characterize mammographic lesions and assess the breast parenchymal pattern on mammograms, resulting in improved characterization of lesions for specific subpopulations, combining the benefits of both techniques.