The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2006

Filed:

Jun. 02, 2000
Applicant:

Masanao Fujieda, Toyohashi, JP;

Inventor:

Masanao Fujieda, Toyohashi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ophthalmic apparatus comprising an optometry device for examining or measuring a patient's eye to obtain measurement data on the eye, a photographing device for photographing the eye, an identification code generating device for extracting a characteristic, which is inherently unique to the eye, from an image of the eye photographed by the photographing device and generating an identification code for the use of eye identification based on the extracted characteristic, and an output device for outputting obtained measurement data in association with the generated identification code.


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