The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Nov. 25, 2003
François Kotian, Guyancourt, FR;
Rémy Klausz, Neuilly sur Seine, FR;
Yves Trousset, Palaiseau, FR;
Régis Vaillant, Villebon sur Yvette, FR;
Guillaume Calmon, Paris, FR;
François Kotian, Guyancourt, FR;
Rémy Klausz, Neuilly sur Seine, FR;
Yves Trousset, Palaiseau, FR;
Régis Vaillant, Villebon sur Yvette, FR;
Guillaume Calmon, Paris, FR;
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A method and apparatus for determining a set of functional parameters using a fluoroscopic radiography apparatus of the type comprising an X-ray source, a detector or recorder of the radiation facing the source, the source and the detector or recorder being installed on a mobile support capable of movement with respect to a table placed between the source and the detector or recorder on which a patient with a region of interest to be X-rayed will be placed. The method comprises a) movement of the support following a given movement with respect to the table, repeated during a given time; b) acquisition by the detector or recorder of a series of images of the region of interest during movement of the support with respect to the table; c) reconstitution of a series of three-dimensional models of the region of interest, starting from a series of acquired images; and d) determination of all functional parameters.