The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2006

Filed:

Jan. 14, 2004
Applicants:

Thomas A. Fields, Winchester, KY (US);

Craig E. Hadady, Lexington, KY (US);

Christopher D. Jones, Georgetown, KY (US);

Philip J. Heink, Lexington, KY (US);

Inventors:

Thomas A. Fields, Winchester, KY (US);

Craig E. Hadady, Lexington, KY (US);

Christopher D. Jones, Georgetown, KY (US);

Philip J. Heink, Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of minimizing visual artifacts resulting from a laser scan process in an electrophotographic machine, the electrophotographic machine including a photoconductive device having an image forming surface. The method including the steps of obtaining correction data relative to a bowed image and offsetting at least a portion of non-bowed image data dependent upon the correction data, and additionally dependent upon halftone cell growth of a halftone cell.


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