The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
May. 06, 2005
Toshihiko Orii, Kanagawa, JP;
Osamu Akimoto, Tokyo, JP;
Hitoshi Abe, Kanagawa, JP;
Naoki Ando, Kanagawa, JP;
Toshihiko Orii, Kanagawa, JP;
Osamu Akimoto, Tokyo, JP;
Hitoshi Abe, Kanagawa, JP;
Naoki Ando, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A method for testing a semiconductor substrate forming a liquid crystal display device, which method enables a potential change corresponding to a defective condition of pixel cell driving circuits to be detected accurately even when a ratio of pixel capacitance to wiring capacitance is lowered with decrease in size or increase in definition of the liquid crystal display device. The method includes: a charge retaining step for making pixel capacitances connected to a plurality of pixel switches selected from all pixel switches connected to one data line retain charge; and a detecting step for simultaneously detecting the charge retained in a plurality of the pixel capacitances in the charge retaining step from the one data line.