The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2006

Filed:

Mar. 28, 2003
Applicants:

Roland Minihold, Munich, DE;

Thilo Bednorz, Erding, DE;

Inventors:

Roland Minihold, Munich, DE;

Thilo Bednorz, Erding, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring device is provided for measuring intermodulation distortion of a measuring object. The measuring device includes a first signal generator which produces a first signal that is supplied to an input of a measuring object, a signal combining device having a first input which is connected to the output of the measuring object, and a signal analyzing device which is connected to the output of the signal combining device. According to the disclosure, a second signal generator which is synchronized with the first signal generator is provided, and second signal generator producing a second signal that is supplied to a second input of the signal combining device.


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