The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2006

Filed:

Nov. 27, 2001
Applicants:

Ulrich Katscher, Norderstedt, DE;

Johannes Jacobus Van Vaals, Eindhoven, NL;

Inventors:

Ulrich Katscher, Norderstedt, DE;

Johannes Jacobus Van Vaals, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an MR imaging method in which the parallel acquisition of the MR data, for example in conformity with the SMASH or SENSE methods, is performed by means of a plurality of receiving coils. The different spatial sensitivity profiles of the receiving coils are used for the image reconstruction. When the sensitivity data used during the image reconstruction do not correspond to the position in space of the receiving coils during the image acquisition, undesirable image artifacts will occur. In accordance with the invention such artifacts are eliminated by (virtually) adapting the spatial sensitivity profiles automatically during the image reconstruction.


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