The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Aug. 25, 2004
Applicants:
Shinya Ono, Shiga, JP;
Yoshinao Kobayashi, Shiga, JP;
Inventors:
Shinya Ono, Shiga, JP;
Yoshinao Kobayashi, Shiga, JP;
Assignees:
Chi Mei Optoelectronics Corp., Tainan, TW;
Kyocera Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/10 (2006.01); G09G 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing an OLED substrate comprises: the first step of obtaining a first current value passing through a switching element group connected to a selection signal line; the second step of obtaining a second current value passing through a switching element group connected to a data signal line; and the third step of operating a current passing through each switching element including an OLED element from the current value for each pulse signal obtained by each of the steps 1 and 2.