The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Oct. 21, 2005
Kazumi Furuta, Akishima, JP;
Makiko Imae, Hino, JP;
Yukihiro Ozeki, Fujisawa, JP;
Konica Minolta Holdings, Inc., Tokyo, JP;
Abstract
An echelon type diffraction structureis formed on the flat optical surface of a lens, thereby ensuring easy designing and easy production of a diffraction structure as a microstructure. Further, the light of wavelength λis applied to the diffraction structurein a tilted position with respect to the optical axis of the lensso that the first order diffracted light produced by the diffraction structuretravels along or parallel to the optical axis of the lens, with the result that improved light transmittance can be maintained. Further, a lensis arranged between a light emitting deviceand lens. Thus, the flat optical surface of the lensis arranged on the side of the end faceof an optical fiber, thereby reducing the deterioration in aberration more effectively.