The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
May. 28, 2004
Norman Chu, San Francisco, CA (US);
Shanlin Duan, Fremont, CA (US);
Patricia Galindo, Morgan Hill, CA (US);
Hang Fai Ngo, San Jose, CA (US);
Yu Lo, Foster City, CA (US);
Nalin Zhou, San Jose, CA (US);
Norman Chu, San Francisco, CA (US);
Shanlin Duan, Fremont, CA (US);
Patricia Galindo, Morgan Hill, CA (US);
Hang Fai Ngo, San Jose, CA (US);
Yu Lo, Foster City, CA (US);
Nalin Zhou, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second calibration point uses a spin down on disk media roughness at a second lower height. With two height data points, a fly height curve of each glide head is approximated very accurately. Once the fly height curve is derived for each head, any fly height can be dialed-in by the disk media certifier for glide testing. This technique achieves glide fly heights between about 4 nm and 8 nm and does so with improved tolerances.