The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Oct. 28, 2003
Koji Urata, Saitama, JP;
Kenichi Anzou, Kawasaki, JP;
Tetsu Hasegawa, Kawasaki, JP;
Chikako Tokunaga, Yokohama, JP;
Koji Urata, Saitama, JP;
Kenichi Anzou, Kawasaki, JP;
Tetsu Hasegawa, Kawasaki, JP;
Chikako Tokunaga, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A method for generating a test vector of an IC including: designating a retrieval condition to select a path on which a signal can be transmitted in the circuit; executing a timing analysis of the circuit based on a circuit information of the circuit, retrieving the path satisfying the retrieval condition, and generating a path list in which cells composing the retrieved path are put in order of executing the timing analysis; generating a test vector to test a path delay fault of the circuit based on the path list; designating an ending condition to end generation of the test vector when the path in the path list for the test vector is distributed over the circuit; and stopping generation of the path list when the ending condition is satisfied.