The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Aug. 21, 2001
David Charles Ricks, Arlington, VA (US);
Jay Scott Goldstein, Centreville, VA (US);
David Charles Ricks, Arlington, VA (US);
Jay Scott Goldstein, Centreville, VA (US);
Science Applications International Corporation, San Diego, CA (US);
Abstract
A method for analyzing data, the data characterized by a set of scalars and a set of vectors, to analyze the data into components related by statistical correlations. In preferred embodiments, the invention includes steps or devices for, receiving a set of a scalars and a set of vectors as the inputs; calculating a correlation direction vector associated with the scalar and vector inputs; calculating the inner products of the input vectors with the correlation direction vector; multiplying the inner products onto the correlation direction vector to form a set of scaled correlation direction vectors; and subtracting the scaled correlation direction vectors from the input vectors to find the projections of the input vectors orthogonal to the correlation direction vector. The outputs are the set of scalar inner products and the set of vectors orthogonal to the correlation vector. The steps or devices can be repeated in cascade to form a multi-stage analysis of the data. The invention can also be used with a steering vector preceding the adaptive analysis stages.