The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2006

Filed:

Nov. 17, 2003
Applicant:

Masahiro Kimura, Wako, JP;

Inventor:

Masahiro Kimura, Wako, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Optical measuring apparatus is constructed to irradiate near infrared light to a desired portion, such as a head, of a person to be measured, receive arriving light from the desired portion and acquire information about a predetermined substance present in the desired portion on the basis of analysis of data related to the received arriving light. Measuring unit of the apparatus is provided on a cover member removably attachable to the person, and includes at least one light irradiation section for irradiating the near infrared light to the desired portion and at least one light reception section for receiving the arriving light from the desired portion. In a state where the cover member is attached to the person, the light irradiation and reception sections are positioned out of contact with the desired portion.


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