The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Jan. 08, 2003
Makoto Fujishima, Yamatokoriyama, JP;
Makoto Fujishima, Yamatokoriyama, JP;
Mori Seiki Co., Ltd., Nara, JP;
Intelligent Manufacturing Systems International, Sacramento, CA (US);
Abstract
The present invention relates to an accuracy analyzing apparatus which is capable of efficiently analyzing accuracies of a machine tool including the perpendicularity of a spindle axis and the thermal displacement of a spindle with a higher level of accuracy at lower costs. The accuracy analyzing apparatus () comprises a laser oscillator () attached to the spindle () for emitting a laser beam having a light axis perpendicular to the spindle axis, an imaging device () having a light receiving section () disposed in the vicinity of the laser oscillator () for receiving the laser beam from the laser oscillator () by the light receiving section () and generating two-dimensional image data, and an analyzer () for analyzing the accuracies of the machine tool () on the basis of the generated image data.