The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Sep. 19, 2003
Chien-li Hung, Hsinchu, TW;
Chi-yuan Liu, Hsinchu, TW;
Chien-Li Hung, Hsinchu, TW;
Chi-Yuan Liu, Hsinchu, TW;
Lite-On IT Corp., , TW;
Abstract
In a method of detecting defects during a write operation for an optical disk recording device, during a period of time immediately after writing begins, a sub-beam added (SBAD) signal is compared with a reference signal having a second threshold frequency. A defect is identified when a difference between the SBAD signal and the reference signal exceeds either a second upper limit or a second lower limit. Then, after the short period of time has elapsed, a SBAD signal is compared with and a reference signal having a first threshold frequency that is less than the second threshold frequency. A defect is identified when a difference between the SBAD signal and the reference signal exceeds either a first upper limit that is less than the second upper limit, or a first lower limit that is greater than the second lower limit.