The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2006

Filed:

Mar. 07, 2003
Applicants:

Dale R. Tyczka, Collegeville, PA (US);

John G. Lehman, Jr., King of Prussia, PA (US);

Alvin B. Cabato, Plymouth Meeting, PA (US);

Daniel Stern, Berwyn, PA (US);

Inventors:

Dale R. Tyczka, Collegeville, PA (US);

John G. Lehman, Jr., King of Prussia, PA (US);

Alvin B. Cabato, Plymouth Meeting, PA (US);

Daniel Stern, Berwyn, PA (US);

Assignee:

LSA, Inc., Arlington, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A Moiré deflectometer includes at least three non-mechanical, transparent, spatial light modulators for demonstrating two sets of patterns on two parallel planes on two of the modulators thereby creating a Moiré fringe pattern and a method for using the same. More particularly, each of the spatial light modulators may be a liquid crystal display, an electrochromic device, a micromirror array, a microlouvre array, an electro-optic device, or a holographic device.


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