The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Aug. 26, 2003
Philip R. Bingham, Knoxville, TN (US);
Gregory R. Hanson, Clinton, TN (US);
Ken W. Tobin, Harriman, TN (US);
Philip R. Bingham, Knoxville, TN (US);
Gregory R. Hanson, Clinton, TN (US);
Ken W. Tobin, Harriman, TN (US);
UT-Battelle LLC, Oak Ridge, TN (US);
Abstract
Systems and methods are described for spatial-heterodyne interferometry for transmission (SHIFT) measurements. A method includes digitally recording a spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis using a reference beam, and an object beam that is transmitted through an object that is at least partially translucent; Fourier analyzing the digitally recorded spatially-heterodyned hologram, by shifting an original origin of the digitally recorded spatially-heterodyned hologram to sit on top of a spatial-heterodyne carrier frequency defined by an angle between the reference beam and the object beam, to define an analyzed image; digitally filtering the analyzed image to cut off signals around the original origin to define a result; and performing an inverse Fourier transform on the result.