The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Oct. 24, 2003
Brian B. Jones, Sunnyvale, CA (US);
Brian B. Jones, Sunnyvale, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method is provided for estimating scattering and includes providing a distribution expression that includes first, second, and third integrals over a source solid angle, a sample area, and detector solid angle respectively, and an integrand that includes a differential-scattering profile; approximating the first and second integrals to be the second integral, wherein the source electromagnetic radiation is approximated to be collimated; approximating the second and third integral to be the third integral, wherein a detector for detecting the electromagnetic radiation scattered from the surface is approximated to be a point detector; transforming the coordinates of the third integral over detector solid angle to be a fourth integral over a single dimension in cosine space, wherein the surface is approximated to be shift invariant; differentiating the fourth integral with respect to the single dimension to generate the differential-scattering profile; and generating an optical system design based on the differential-scattering profile.