The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Oct. 10, 2002
Applicant:
Philippe Lafon, Cagnes sur Mer, FR;
Inventor:
Philippe Lafon, Cagnes sur Mer, FR;
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/01 (2006.01); H04N 9/74 (2006.01);
U.S. Cl.
CPC ...
Abstract
Image resizing through resampling by poly-phase filtering with a phase generation from input parameters but with lower resolution of the phase for filter selection. Field and frame mode selection creates initial offsets for alignment. A phase accumulator generates sample addressing with its most significant bits, generates filter selection with its middle bits, and maintains its least significant bits for accuracy.
Lafon, Philippe. (2006). Image resizing system and method (U.S. Patent No. 7119845). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7119845
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile