The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2006

Filed:

Mar. 01, 2004
Applicants:

Raj Bridgelall, Mount Sinai, NY (US);

Mark William Duron, East Patchogue, NY (US);

Martin J. Strzelczyk, Farmingville, NY (US);

Inventors:

Raj Bridgelall, Mount Sinai, NY (US);

Mark William Duron, East Patchogue, NY (US);

Martin J. Strzelczyk, Farmingville, NY (US);

Assignee:

Symbol Technologies, Inc., Holtsville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/87 (2006.01); G01S 13/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method is provided for locating objects using RFID tags. The system and method uses an RFID reader and a distance calculator to efficiently and accurately determine the location of objects that include an RFID tag. The RFID reader transmits a plurality of signals to the RFID tag, with the plurality of signals having different fundamental frequencies. In response, the RFID tag backscatter modulates the plurality of transmitted signals to create a plurality of backscatter modulated signals. The RFID reader receives and demodulates the plurality of backscatter modulated signals. The distance calculator determines the phase of the plurality of backscatter modulated signals and determines a rate of change of the phase in the backscatter modulated signals with respect to the rate of change in the fundamental frequency of the transmitted signals and uses this information to calculate the distance to the RFID tag.


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