The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Sep. 30, 2004
Applicants:
Xiaodong Che, Saratoga, CA (US);
Terence Tin-lok Lam, Cupertino, CA (US);
Zhong-heng Lin, Santa Clara, CA (US);
Xiaoyu Sui, Fremont, CA (US);
Inventors:
Xiaodong Che, Saratoga, CA (US);
Terence Tin-Lok Lam, Cupertino, CA (US);
Zhong-heng Lin, Santa Clara, CA (US);
Xiaoyu Sui, Fremont, CA (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/127 (2006.01); G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for measuring a magnetic read width MRW of a magnetic read sensor directly from the derivative of a full track profile, with better accuracy and more advantages than the micro-track method was invented and also there is no need to use a separate wide write head. The magnetic write width MWW of the write head, without the influence of sensor side reading, can also be obtained by this method along with the MRW with no additional calculations.