The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Dec. 31, 2002
Jack A. Syage, Huntington Beach, CA (US);
Karl A. Hanold, Huntington Beach, CA (US);
Matthew D. Evans, Irvine, CA (US);
Brian J. Nies, Tustin, CA (US);
Jack A. Syage, Huntington Beach, CA (US);
Karl A. Hanold, Huntington Beach, CA (US);
Matthew D. Evans, Irvine, CA (US);
Brian J. Nies, Tustin, CA (US);
Syagen Technology, Tustin, CA (US);
Abstract
A detector system that contains two inlet port coupled to a photoionization chamber. One inlet port allows for the introduction of a test sample. The test sample may contain contaminants, drugs, explosive, etc. that are to be detected. The other port allows for the simultaneous introduction of a standard sample. The standard sample can be used to calibrate and/or diagnose the detector system. Simultaneous introduction of the standard sample provides for real time calibration/diagnostics of the detector during detection of trace molecules in the test sample. The photoizonizer ionizes the samples which are then directed into a mass detector for detection of trace molecules. The detector system may also include inlet embodiments that allow for vaporization of liquid samples introduced to a low pressure photoionizer.