The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Jan. 27, 2004
Jan-willem Pieterse, San Jose, CA (US);
Hoang Nguyen, Livermore, CA (US);
Rosemary O. Abriam, Livermore, CA (US);
Andrew H. Cordes, San Jose, CA (US);
Jan-Willem Pieterse, San Jose, CA (US);
Hoang Nguyen, Livermore, CA (US);
Rosemary O. Abriam, Livermore, CA (US);
Andrew H. Cordes, San Jose, CA (US);
Bookham Technology PLC, , GB;
Abstract
An apparatus and method for determining a physical parameter affecting an optical sensor or a number of sensors in a network. The apparatus uses a narrow linewidth source at an emission wavelength λand an arrangement for varying the emission wavelength λof the radiation. An analysis module with curve fitting is used to generate a fit to the response signal obtained from the optical sensor. The physical parameter is determined form the fit rather than from the response signal. The apparatus can be employed with Bragg gratings, etalons, Fabry Perot elements or other optical sensors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile