The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Jun. 04, 2004
Applicants:

John M. Bach, Sugar Land, TX (US);

Rand B. Carawan, Stafford, TX (US);

Hemant Joshi, Plano, TX (US);

David A. Thomas, Sugar Land, TX (US);

Inventors:

John M. Bach, Sugar Land, TX (US);

Rand B. Carawan, Stafford, TX (US);

Hemant Joshi, Plano, TX (US);

David A. Thomas, Sugar Land, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer method of analyzing an integrated circuit ('IC') masked design data, comprising grouping into a cluster areas of layers preceding a target metal layer that are suitable for milling, deleting portions of the target metal layer that do not meet minimum tool spacing requirements to produce a modified metal layer, deleting portions of the modified metal layer that do not meet minimum design rule width requirements to produce a final metal layer, and comparing the final metal layer and the cluster to identify common areas.


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